Showing results: 31 - 45 of 283 items found.
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Delserro Engineering Solutions
Under normal conditions it may take years to gather failure data on the life cycle of new products. Through accelerated life testing the overall time to failure can be reduced to weeks by increasing the frequency of the field loads and by removing insignificant stress components. In addition, life cycle testing on a product can be reduced or accelerated dramatically by increasing the stress levels to higher than normal. Putting a product through Accelerated Life Testing can reduce test time from weeks to days while still achieving satisfactory results saving both time and money.
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Premier Electrosystems
Premier's Endurance Tester, also known as on-off tester and life tester, is used to perform the life test of the unit. The Endurance Tester, switches on the unit for a set time and then turns it off for a set time. This entire cycle is repeated multiple times, to simulate the behavior of the unit under extended use
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Model 933 -
TRICOR Systems Inc.
The Model 933A Life Cycle Test System is a low cost, generic test platform used to perform cycling of keypads, keyboards, membranes, switches, or any product requiring fatigue testing.
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Dayton T. Brown, Inc.
MIL-STD-810 is a US military specification that puts emphasis on tailoring the test requirements to the conditions that the equipment will experience during its service life.
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CH316 -
Lisun Electronics Inc.
• Measure 16 samples at the same time, evaluate and record the life of each sample. • Very flexible: Samples can be added and changed at anytime. • The life of each sample is readable at anytime. • The switch ON/OFF time is adjustable (Test period is min 1s). • Automatically remember the test result when the power is off, and resume the old measurement when power is on. • Sound and light alarm when the products were failed.
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ATS-3100 RTS -
Astronics Corporation
Extend the life of your legacy radios while simultaneously supporting modern radio technology, both airborne and ground, with the ATS-3100 Radio Test Set (RTS) - the complete solution for military and commercial radio test.
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Test program Comparator -
Test Insight Ltd.
TP-C is part of the new test program life cycle solutions from TestInsightAddress concerns such as - Why does my test program yield differently in two sites ? Is it really the same program ? What is different in a given test program revision ?
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Labodam
Labodam temperature and humidity test chambers are designed to simulate constant climactic conditions for testing a wide variety of products for their quality, performance, shelf life, and stability.
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Teradyne, Inc.
HSSub is a software-defined family of PXIe Instrumentation that can be integrated and scaled to support digital test applications throughout the product life cycle from design verification to production and sustainment.
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US Technologies, Inc.
Full ATE Test Capability. Go/No go testing-power supply batch testing. Complete technical and customer support. End of Life Manufacturing specialists. Complete Testing/Repair
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Techimp HQ S.r.L
It is a deeply customizable test bench which is suitable to generate frequency and amplitude controlled voltage. This test bench could be used for life test or quality test on samples or devices. It can be configured both for sinusoidal test (STANDARD version) and both for square wave or pulse test (TechSQUARE). It includes safety systems for avoiding overload and incorrect use.
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imc Test & Measurement GmbH
Endurance test stands to validate the life expectancy often run 24/7. We therefore place great store on the reliability of imc test stands. Whether it be the mechanics, data acquisition or automation – everything has been designed for endurance operation.
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STAr Technologies, Inc.
STAr uses its extensive industry expertise to design, build, test and support reliability systems for semiconductor devices and interconnects reliability life test, IC product burn-in, environmental test, product screening, PCB reliability test, etc. to fulfill all the needs to build a solid reliability engineering system.
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Meritec
Meritec's 1MM Slot Test Connector was developed to eliminate many of the common problems associated with using a standard connector in a test application. When testing, the PCB is plugged in and out of the connector many times. The wiping action that occurs between the contacts and the board starts to wear down the plating on the contacts and the plastic housing itself.At some point in time the connector becomes a liability and can no longer be considered reliable. The standard connectors being used today for test applications have a life cycle of 250 to 500 (the number of insertion and withdrawals applied to the connector). Meritec's Slot Test Connector has a life cycle greater than 100,000!
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Spectrum BT -
Teradyne, Inc.
Designed to meet the needs of product engineering labs, production lines, test development centers, and repair depots, the Spectrum BT is a configurable and scalable functional test system. This focused system solves typical functional test coverage challenges throughout the defense/aerospace product life cycle—and it’s upgradable as test requirements evolve.
